Original language | English |
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Pages (from-to) | 401-409 |
Number of pages | 9 |
Journal | Canadian Journal of Plant Pathology |
Volume | 34 |
Issue number | 3 |
DOIs | |
Publication status | Published - Jul 2012 |
Development of a reliable and rapid detached leaf assay to detect resistance to the fungal disease phomopsis leaf blight, caused by Diaporthe toxica, in Lupinus albus
Raymond Cowley, David Luckett, John Harper, Gavin Ash
Research output: Contribution to journal › Article › peer-review
7
Citations
(Scopus)