Development of a reliable and rapid detached leaf assay to detect resistance to the fungal disease phomopsis leaf blight, caused by Diaporthe toxica, in Lupinus albus

Raymond Cowley, David Luckett, John Harper, Gavin Ash

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)
Original languageEnglish
Pages (from-to)401-409
Number of pages9
JournalCanadian Journal of Plant Pathology
Issue number3
Publication statusPublished - Jul 2012

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