Development of a reliable and rapid detached leaf assay to detect resistance to the fungal disease phomopsis leaf blight, caused by Diaporthe toxica, in Lupinus albus

Research output: Contribution to journalArticle

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)401-409
Number of pages9
JournalCanadian Journal of Plant Pathology
Volume34
Issue number3
DOIs
Publication statusPublished - Jul 2012

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