High Accuracy Measurement Technology of CCD and its Industrial Application

P. Hao; X. Zhang; Y. Li; Lihong Zheng

doi:10.1109/ICCIS.2008.4670737

High Accuracy Measurement Technology of CCD and its Industrial Application

P. Hao, X. Zhang, Y. Li, Lihong Zheng

Research output: Book chapter/Published conference paper › Conference paper › peer-review

1 Citation (Scopus)

Abstract

This paper introduces a subpixel measuring method for industry dimension measurement. The new point is high accurate edge point location which is to use spatial moments to estimate the exact location of edge within a pixel. The proposed method includes of camera calibration, image preprocessing, edge detection, sub pixel location and dimension obtain. In practical, there are many factors which affect the measurement result. Noise may play key role. In order to eliminate the noise effect on measurement, meanwhile, to keep it from expanding and save the details of image edge, a nonlinear filter algorithm is proposed. Furthermore, subdivision technology based on spatial moment help to improve accuracy of edge location. Real time industrial measure results have demonstrated that high accuracy dimensional measurement technology could reach the accuracy index whose maximum measure error less than 0.01 mm. Therefore, this new method can be further developed and applied in many kinds of real time applications.

Original language	English
Title of host publication	2008 IEEE International Conference on Cybernetics and Intelligent Systems (ICCIS)
Place of Publication	USA/Singapore
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	423-429
Number of pages	7
ISBN (Electronic)	9781424416738
DOIs	https://doi.org/10.1109/ICCIS.2008.4670737
Publication status	Published - 2008
Event	IEEE International Conference on Cybernetics and Intelligent Systems - China, China Duration: 03 Jun 2008 → 06 Jun 2008

Conference

Conference	IEEE International Conference on Cybernetics and Intelligent Systems
Country/Territory	China
Period	03/06/08 → 06/06/08

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10.1109/ICCIS.2008.4670737

Cite this

@inproceedings{eca27ed64525429fa87370004c7ea69e,

title = "High Accuracy Measurement Technology of CCD and its Industrial Application",

abstract = "This paper introduces a subpixel measuring method for industry dimension measurement. The new point is high accurate edge point location which is to use spatial moments to estimate the exact location of edge within a pixel. The proposed method includes of camera calibration, image preprocessing, edge detection, sub pixel location and dimension obtain. In practical, there are many factors which affect the measurement result. Noise may play key role. In order to eliminate the noise effect on measurement, meanwhile, to keep it from expanding and save the details of image edge, a nonlinear filter algorithm is proposed. Furthermore, subdivision technology based on spatial moment help to improve accuracy of edge location. Real time industrial measure results have demonstrated that high accuracy dimensional measurement technology could reach the accuracy index whose maximum measure error less than 0.01 mm. Therefore, this new method can be further developed and applied in many kinds of real time applications.",

keywords = "CCD, High accuracy measurement",

author = "P. Hao and X. Zhang and Y. Li and Lihong Zheng",

note = "Imported on 03 May 2017 - DigiTool details were: publisher = USA/Singapore: Institute of Electrical and Electronics Engineers (IEEE) Press, 2008. Event dates (773o) = 3-6 June 2008; Parent title (773t) = IEEE International Conference on Cybernetics and Intelligent Systems.; IEEE International Conference on Cybernetics and Intelligent Systems ; Conference date: 03-06-2008 Through 06-06-2008",

year = "2008",

doi = "10.1109/ICCIS.2008.4670737",

language = "English",

pages = "423--429",

booktitle = "2008 IEEE International Conference on Cybernetics and Intelligent Systems (ICCIS)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

}

Hao, P, Zhang, X, Li, Y & Zheng, L 2008, High Accuracy Measurement Technology of CCD and its Industrial Application. in 2008 IEEE International Conference on Cybernetics and Intelligent Systems (ICCIS). IEEE, Institute of Electrical and Electronics Engineers, USA/Singapore, pp. 423-429, IEEE International Conference on Cybernetics and Intelligent Systems, China, 03/06/08. https://doi.org/10.1109/ICCIS.2008.4670737

High Accuracy Measurement Technology of CCD and its Industrial Application. / Hao, P.; Zhang, X.; Li, Y. et al.
2008 IEEE International Conference on Cybernetics and Intelligent Systems (ICCIS). USA/Singapore: IEEE, Institute of Electrical and Electronics Engineers, 2008. p. 423-429.

Research output: Book chapter/Published conference paper › Conference paper › peer-review

TY - GEN

T1 - High Accuracy Measurement Technology of CCD and its Industrial Application

AU - Hao, P.

AU - Zhang, X.

AU - Li, Y.

AU - Zheng, Lihong

N1 - Imported on 03 May 2017 - DigiTool details were: publisher = USA/Singapore: Institute of Electrical and Electronics Engineers (IEEE) Press, 2008. Event dates (773o) = 3-6 June 2008; Parent title (773t) = IEEE International Conference on Cybernetics and Intelligent Systems.

PY - 2008

Y1 - 2008

N2 - This paper introduces a subpixel measuring method for industry dimension measurement. The new point is high accurate edge point location which is to use spatial moments to estimate the exact location of edge within a pixel. The proposed method includes of camera calibration, image preprocessing, edge detection, sub pixel location and dimension obtain. In practical, there are many factors which affect the measurement result. Noise may play key role. In order to eliminate the noise effect on measurement, meanwhile, to keep it from expanding and save the details of image edge, a nonlinear filter algorithm is proposed. Furthermore, subdivision technology based on spatial moment help to improve accuracy of edge location. Real time industrial measure results have demonstrated that high accuracy dimensional measurement technology could reach the accuracy index whose maximum measure error less than 0.01 mm. Therefore, this new method can be further developed and applied in many kinds of real time applications.

AB - This paper introduces a subpixel measuring method for industry dimension measurement. The new point is high accurate edge point location which is to use spatial moments to estimate the exact location of edge within a pixel. The proposed method includes of camera calibration, image preprocessing, edge detection, sub pixel location and dimension obtain. In practical, there are many factors which affect the measurement result. Noise may play key role. In order to eliminate the noise effect on measurement, meanwhile, to keep it from expanding and save the details of image edge, a nonlinear filter algorithm is proposed. Furthermore, subdivision technology based on spatial moment help to improve accuracy of edge location. Real time industrial measure results have demonstrated that high accuracy dimensional measurement technology could reach the accuracy index whose maximum measure error less than 0.01 mm. Therefore, this new method can be further developed and applied in many kinds of real time applications.

KW - CCD

KW - High accuracy measurement

U2 - 10.1109/ICCIS.2008.4670737

DO - 10.1109/ICCIS.2008.4670737

M3 - Conference paper

SP - 423

EP - 429

BT - 2008 IEEE International Conference on Cybernetics and Intelligent Systems (ICCIS)

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA/Singapore

T2 - IEEE International Conference on Cybernetics and Intelligent Systems

Y2 - 3 June 2008 through 6 June 2008

ER -

High Accuracy Measurement Technology of CCD and its Industrial Application

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