High Accuracy Measurement Technology of CCD and its Industrial Application

P. Hao, X. Zhang, Y. Li, Lihong Zheng

Research output: Book chapter/Published conference paperConference paper

Abstract

This paper introduces a subpixel measuring method for industry dimension measurement. The new point is high accurate edge point location which is to use spatial moments to estimate the exact location of edge within a pixel. The proposed method includes of camera calibration, image preprocessing, edge detection, sub pixel location and dimension obtain. In practical, there are many factors which affect the measurement result. Noise may play key role. In order to eliminate the noise effect on measurement, meanwhile, to keep it from expanding and save the details of image edge, a nonlinear filter algorithm is proposed. Furthermore, subdivision technology based on spatial moment help to improve accuracy of edge location. Real time industrial measure results have demonstrated that high accuracy dimensional measurement technology could reach the accuracy index whose maximum measure error less than 0.01 mm. Therefore, this new method can be further developed and applied in many kinds of real time applications.
Original languageEnglish
Title of host publication2008 IEEE International Conference on Cybernetics and Intelligent Systems (ICCIS)
Place of PublicationUSA/Singapore
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages423-429
Number of pages7
ISBN (Electronic)9781424416738
DOIs
Publication statusPublished - 2008
EventIEEE International Conference on Cybernetics and Intelligent Systems - China, China
Duration: 03 Jun 200806 Jun 2008

Conference

ConferenceIEEE International Conference on Cybernetics and Intelligent Systems
CountryChina
Period03/06/0806/06/08

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  • Cite this

    Hao, P., Zhang, X., Li, Y., & Zheng, L. (2008). High Accuracy Measurement Technology of CCD and its Industrial Application. In 2008 IEEE International Conference on Cybernetics and Intelligent Systems (ICCIS) (pp. 423-429). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICCIS.2008.4670737