TY - JOUR
T1 - Nanoscale chemical mapping using three-dimensional adiabatic compression of surface plasmon polaritons
AU - De Angelis, Francesco
AU - Das, Gobind
AU - Candeloro, Patrizio
AU - Patrini, Maddalena
AU - Galli, Matteo
AU - Bek, Alpan
AU - Lazzarino, Marco
AU - Maksymov, Ivan
AU - Liberale, Carlo
AU - Andreani, Lucio Claudio
AU - Di Fabrizio, Enzo
PY - 2010/1
Y1 - 2010/1
N2 - The fields of plasmonics, Raman spectroscopy and atomic force microscopy have recently undergone considerable development, but independently of one another. By combining these techniques, a range of complementary information could be simultaneously obtained at a single molecule level. Here, we report the design, fabrication and application of a photonic-plasmonic device that is fully compatible with atomic force microscopy and Raman spectroscopy. Our approach relies on the generation and localization of surface plasmon polaritons by means of adiabatic compression through a metallic tapered waveguide to create strongly enhanced Raman excitation in a region just a few nanometres across. The tapered waveguide can also be used as an atomic force microscope tip. Using the device, topographic, chemical and structural information about silicon nanocrystals may be obtained with a spatial resolution of 7nm.
AB - The fields of plasmonics, Raman spectroscopy and atomic force microscopy have recently undergone considerable development, but independently of one another. By combining these techniques, a range of complementary information could be simultaneously obtained at a single molecule level. Here, we report the design, fabrication and application of a photonic-plasmonic device that is fully compatible with atomic force microscopy and Raman spectroscopy. Our approach relies on the generation and localization of surface plasmon polaritons by means of adiabatic compression through a metallic tapered waveguide to create strongly enhanced Raman excitation in a region just a few nanometres across. The tapered waveguide can also be used as an atomic force microscope tip. Using the device, topographic, chemical and structural information about silicon nanocrystals may be obtained with a spatial resolution of 7nm.
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U2 - 10.1038/nnano.2009.348
DO - 10.1038/nnano.2009.348
M3 - Article
AN - SCOPUS:73849087632
SN - 1748-3387
VL - 5
SP - 67
EP - 72
JO - Nature Nanotechnology
JF - Nature Nanotechnology
IS - 1
ER -