Objective analysis of marker bias in higher education

Subrata Chakraborty; Xujuan Zhou; Abdul Hafeez-Baig; Raj Gururajan; Manoranjan Paul; Anuradha Mandal; Anila Elizabeth Chacko; Prabal D. Barua

doi:10.1109/TALE.2016.7851839

Objective analysis of marker bias in higher education

Subrata Chakraborty, Xujuan Zhou, Abdul Hafeez-Baig, Raj Gururajan, Manoranjan Paul, Anuradha Mandal, Anila Elizabeth Chacko, Prabal D. Barua

Research output: Book chapter/Published conference paper › Conference paper › peer-review

1 Citation (Scopus)

Abstract

Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.

Original language	English
Title of host publication	Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	453-457
Number of pages	5
ISBN (Electronic)	9781509055982
ISBN (Print)	9781509055999 (Print on demand)
DOIs	https://doi.org/10.1109/TALE.2016.7851839
Publication status	Published - 13 Feb 2017
Event	2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering: IEEE TALE 2016 - Dusit Thani Bangkok Hotel, Bangkok, Thailand Duration: 07 Dec 2016 → 09 Dec 2016 http://www.tale-conference.org/tale2016/index.php (Conference website)

Conference

Conference	2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering
Country/Territory	Thailand
City	Bangkok
Period	07/12/16 → 09/12/16
Other	The aim of TALE 2016 is to provide a forum for academicians and professionals from various educational fields and with cross-disciplinary interests to network, share knowledge and engage in dialogue around the theme of fostering innovation and excellence in engineering education. To this end, both research and practice-oriented papers are invited that encompass all aspects of education in the engineering fields (including computing, computer science, information technology and cognate disciplines). The conference will feature traditional paper presentations, workshops, as well as keynotes by renowned educational experts and authorities.
Internet address	http://www.tale-conference.org/tale2016/index.php (Conference website)

Access to Document

10.1109/TALE.2016.7851839

Cite this

Chakraborty, S., Zhou, X., Hafeez-Baig, A., Gururajan, R., Paul, M., Mandal, A., Chacko, A. E., & Barua, P. D. (2017). Objective analysis of marker bias in higher education. In Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) (pp. 453-457). Article 7851839 IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/TALE.2016.7851839

@inproceedings{2fd54933027a4eeb8f1bbd9375cbdbbf,

title = "Objective analysis of marker bias in higher education",

abstract = "Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.",

keywords = "Assessment bias, Bias reduction, Higher education, Marker bias, Results analysis",

author = "Subrata Chakraborty and Xujuan Zhou and Abdul Hafeez-Baig and Raj Gururajan and Manoranjan Paul and Anuradha Mandal and Chacko, {Anila Elizabeth} and Barua, {Prabal D.}",

note = "Includes bibliographical references.; 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering : IEEE TALE 2016 ; Conference date: 07-12-2016 Through 09-12-2016",

year = "2017",

month = feb,

day = "13",

doi = "10.1109/TALE.2016.7851839",

language = "English",

isbn = "9781509055999 (Print on demand)",

pages = "453--457",

booktitle = "Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

url = "http://www.tale-conference.org/tale2016/index.php",

}

Chakraborty, S, Zhou, X, Hafeez-Baig, A, Gururajan, R, Paul, M, Mandal, A, Chacko, AE & Barua, PD 2017, Objective analysis of marker bias in higher education. in Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)., 7851839, IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 453-457, 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering, Bangkok, Thailand, 07/12/16. https://doi.org/10.1109/TALE.2016.7851839

Objective analysis of marker bias in higher education. / Chakraborty, Subrata; Zhou, Xujuan; Hafeez-Baig, Abdul et al.
Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE). United States: IEEE, Institute of Electrical and Electronics Engineers, 2017. p. 453-457 7851839.

Research output: Book chapter/Published conference paper › Conference paper › peer-review

TY - GEN

T1 - Objective analysis of marker bias in higher education

AU - Chakraborty, Subrata

AU - Zhou, Xujuan

AU - Hafeez-Baig, Abdul

AU - Gururajan, Raj

AU - Paul, Manoranjan

AU - Mandal, Anuradha

AU - Chacko, Anila Elizabeth

AU - Barua, Prabal D.

N1 - Includes bibliographical references.

PY - 2017/2/13

Y1 - 2017/2/13

N2 - Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.

AB - Marker bias has been a serious factor contributing to discrepancy in assessments. In this study we analyze one year students' results in a Business Faculty within an Australian university to understand the extent of variation induced by marker bias in multiple marker scenarios. The study shows interesting insights regarding the marking trends of a particular marker, and shows variations among markers in a particular course. The study paves the way for quantification of marker variation through objective analysis.

KW - Assessment bias

KW - Bias reduction

KW - Higher education

KW - Marker bias

KW - Results analysis

UR - http://www.scopus.com/inward/record.url?scp=85015153201&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85015153201&partnerID=8YFLogxK

UR - http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7819650

UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7851756

UR - http://www.tale-conference.org/tale2016/cfp_tale2016.php

U2 - 10.1109/TALE.2016.7851839

DO - 10.1109/TALE.2016.7851839

M3 - Conference paper

AN - SCOPUS:85015153201

SN - 9781509055999 (Print on demand)

SP - 453

EP - 457

BT - Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States

T2 - 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering

Y2 - 7 December 2016 through 9 December 2016

ER -

Chakraborty S, Zhou X, Hafeez-Baig A, Gururajan R, Paul M, Mandal A et al. Objective analysis of marker bias in higher education. In Proceedings of 2016 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE). United States: IEEE, Institute of Electrical and Electronics Engineers. 2017. p. 453-457. 7851839 doi: 10.1109/TALE.2016.7851839

Objective analysis of marker bias in higher education

Abstract

Conference

Access to Document

Other files and links

Fingerprint

Cite this