On the repudiability of device identification and image integrity verification using sensor pattern noise

Chang Tsun Li, Chih Yuan Chang, Yue Li

    Research output: Book chapter/Published conference paperConference paperpeer-review

    16 Citations (Scopus)

    Abstract

    In this work we study the power of the methods for digital device identification and image integrity verification, which rely on sensor pattern noise as device signatures, and the repudiability of the conclusions drawn from the information produced by this type of methods. We prove that the sensor pattern noise existing in the original images can be destroyed so as to confuse the investigators. We also prove that sensor pattern noise of device A can be easily embedded in the images produced by another device B so that the device identifier would mistakenly suggest that the images were produced by device A, rather than by B, and mislead forensic investigations.

    Original languageEnglish
    Title of host publicationInformation Security and Digital Forensics - First International Conference, ISDF 2009, Revised Selected Papers
    Pages19-25
    Number of pages7
    Volume41 LNICST
    DOIs
    Publication statusPublished - 2010
    Event1st International Conference on Information Security and Digital Forensics, ISDF 2009 - London, United Kingdom
    Duration: 07 Sep 200909 Sep 2009

    Publication series

    NameLecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering
    Volume41 LNICST
    ISSN (Print)1867-8211

    Conference

    Conference1st International Conference on Information Security and Digital Forensics, ISDF 2009
    Country/TerritoryUnited Kingdom
    CityLondon
    Period07/09/0909/09/09

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