TY - JOUR
T1 - Prediction of area and length complexity measures for binary decision diagrams
AU - Bega, Azam
AU - Penatiyana Withanage, Chandana
N1 - Imported on 12 Apr 2017 - DigiTool details were: Journal title (773t) = Expert Systems with Applications. ISSNs: 0957-4174;
PY - 2010
Y1 - 2010
N2 - Measuring the complexity of functions that represent digital circuits in non-uniform computation models is an important area of computer science theory. This paper presents a comprehensive set of machine learnt models for predicting the complexity properties of circuits represented by binary decision diagrams. The models are created using Monte Carlo data for a wide range of circuit inputs and number of minterms. The models predict number of nodes as representations of circuit size/area and path lengths: average path length, longest path length, and shortest path length. The models have been validated using an arbitrarily-chosen subset of ISCAS-85 and MCNC-91 benchmark circuits. The models yield reasonably low RMS errors for predictions, so they can be used to estimate complexity metrics of circuits without having to synthesize them.Keywords: Circuit complexity; Complexity prediction; Area complexity; Path length complexity; Binary decision diagrams; Machine learning; Neural network modeling
AB - Measuring the complexity of functions that represent digital circuits in non-uniform computation models is an important area of computer science theory. This paper presents a comprehensive set of machine learnt models for predicting the complexity properties of circuits represented by binary decision diagrams. The models are created using Monte Carlo data for a wide range of circuit inputs and number of minterms. The models predict number of nodes as representations of circuit size/area and path lengths: average path length, longest path length, and shortest path length. The models have been validated using an arbitrarily-chosen subset of ISCAS-85 and MCNC-91 benchmark circuits. The models yield reasonably low RMS errors for predictions, so they can be used to estimate complexity metrics of circuits without having to synthesize them.Keywords: Circuit complexity; Complexity prediction; Area complexity; Path length complexity; Binary decision diagrams; Machine learning; Neural network modeling
U2 - 10.1016/j.eswa.2009.09.003
DO - 10.1016/j.eswa.2009.09.003
M3 - Article
SN - 0957-4174
VL - 37
SP - 2864
EP - 2873
JO - Expert Systems with Applications
JF - Expert Systems with Applications
IS - 4
ER -