Quality control and multi-lesion detection in automated retinopathy classification using a visual words dictionary

Herbert Jelinek; Ramon Pires; Rafael Padilha; Siome Goldenstein; Jacques Wainer; Anderson Rocha

Quality control and multi-lesion detection in automated retinopathy classification using a visual words dictionary

Herbert Jelinek, Ramon Pires, Rafael Padilha, Siome Goldenstein, Jacques Wainer, Anderson Rocha

Research output: Book chapter/Published conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	5857-5860
Number of pages	4
Publication status	Published - 2013
Event	2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) - Osaka International Convention Center, Osaka, Japan Duration: 03 Jul 2013 → 07 Jul 2013 https://researchr.org/publication/embc-2013

Conference

Conference	2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)
Country/Territory	Japan
City	Osaka
Period	03/07/13 → 07/07/13
Other	The conference will cover diverse topics such as biomedical engineering, healthcare technologies, and medical and clinical applications. The conference program will consist of invited plenary lectures, symposia, workshops, invited sessions and oral and poster sessions of unsolicited contributions. All papers will be peer reviewed; accepted papers of up to four pages will appear in the Conference Proceedings and be indexed by IEEE Xplore and Medline/PubMed.
Internet address	https://researchr.org/publication/embc-2013

Cite this

Jelinek, H., Pires, R., Padilha, R., Goldenstein, S., Wainer, J., & Rocha, A. (2013). Quality control and multi-lesion detection in automated retinopathy classification using a visual words dictionary. In Proceedings of the 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (pp. 5857-5860). IEEE, Institute of Electrical and Electronics Engineers.

Jelinek, Herbert ; Pires, Ramon ; Padilha, Rafael et al. / Quality control and multi-lesion detection in automated retinopathy classification using a visual words dictionary. Proceedings of the 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society . IEEE, Institute of Electrical and Electronics Engineers, 2013. pp. 5857-5860

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Jelinek, H, Pires, R, Padilha, R, Goldenstein, S, Wainer, J & Rocha, A 2013, Quality control and multi-lesion detection in automated retinopathy classification using a visual words dictionary. in Proceedings of the 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society . IEEE, Institute of Electrical and Electronics Engineers, pp. 5857-5860, 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Osaka, Japan, 03/07/13.

Quality control and multi-lesion detection in automated retinopathy classification using a visual words dictionary. / Jelinek, Herbert; Pires, Ramon; Padilha, Rafael et al.
Proceedings of the 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society . IEEE, Institute of Electrical and Electronics Engineers, 2013. p. 5857-5860.

Research output: Book chapter/Published conference paper › Conference paper › peer-review

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AU - Pires, Ramon

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AU - Rocha, Anderson

N1 - Imported on 03 May 2017 - DigiTool details were: publisher = IEEE, 2013. Parent title (773t) = IEEE International Conference of Engineering in Medicine and Biology Society.

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Jelinek H, Pires R, Padilha R, Goldenstein S, Wainer J, Rocha A. Quality control and multi-lesion detection in automated retinopathy classification using a visual words dictionary. In Proceedings of the 2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society . IEEE, Institute of Electrical and Electronics Engineers. 2013. p. 5857-5860