Survey on memrister models

S. Singh, P. W C Prasad, Abeer Alsadoon, A. Beg, L. Pham, A. Elchouemi

Research output: Book chapter/Published conference paperConference paper

2 Citations (Scopus)

Abstract

While hardware in a computer has developed greatly, users still have faced problems with its speed, and memory in terms of its performance. The recent developments in memristors made it possible to reduce the problems, as memristive models have been be designed to suit the requirements of the time. However, different characteristics are expected from memristors depending upon its applications. The paper aims to compare three major models of memristors focusing on their advantages and limitations. It identifies the most suitable model of memristor that satisfies the memristive device conditions. Out of the three models, Voltage threshold adaptive memristor model (VTEAM) fits into the requirements and it has sufficient accuracy and computational efficiency.
Original languageEnglish
Title of host publicationICEIC 2016
Subtitle of host publicationInternational Conference on Electronics, Information, and Communications (ICEIC) 2016
Place of PublicationUnited States
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1-7
Number of pages7
ISBN (Electronic)9781467380164
DOIs
Publication statusPublished - 07 Sep 2016
Event15th international Conference on Electronics, Information, and Communication: ICEIC 2016 - Hyatt Regency Resort & Spa, Danang, Viet Nam
Duration: 27 Jan 201630 Jan 2016
http://www.iceic2016.org/

Conference

Conference15th international Conference on Electronics, Information, and Communication
CountryViet Nam
CityDanang
Period27/01/1630/01/16
OtherThe 15th International Conference on Electronics, Information, and Communication (ICEIC 2016) is a forum open to all the participants who are willing to broaden professional contacts and to discuss the state-of-the-art technical topics. Especially the participation from Asia-pacific region is encouraged. The general session of ICEIC 2016 will include more than 300 oral and poster presentations. In addition, the conference will offer special sessions, invited talk, keynote speeches, and tutorials to cover a broader spectrum of topics on electronics, and communication technologies.
Internet address

Fingerprint

Memristors
Computational efficiency
Threshold voltage
Computer hardware
Data storage equipment

Cite this

Singh, S., Prasad, P. W. C., Alsadoon, A., Beg, A., Pham, L., & Elchouemi, A. (2016). Survey on memrister models. In ICEIC 2016: International Conference on Electronics, Information, and Communications (ICEIC) 2016 (pp. 1-7). [7563017] United States: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ELINFOCOM.2016.7563017
Singh, S. ; Prasad, P. W C ; Alsadoon, Abeer ; Beg, A. ; Pham, L. ; Elchouemi, A. / Survey on memrister models. ICEIC 2016: International Conference on Electronics, Information, and Communications (ICEIC) 2016. United States : IEEE, Institute of Electrical and Electronics Engineers, 2016. pp. 1-7
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Singh, S, Prasad, PWC, Alsadoon, A, Beg, A, Pham, L & Elchouemi, A 2016, Survey on memrister models. in ICEIC 2016: International Conference on Electronics, Information, and Communications (ICEIC) 2016., 7563017, IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 1-7, 15th international Conference on Electronics, Information, and Communication, Danang, Viet Nam, 27/01/16. https://doi.org/10.1109/ELINFOCOM.2016.7563017

Survey on memrister models. / Singh, S.; Prasad, P. W C; Alsadoon, Abeer; Beg, A.; Pham, L.; Elchouemi, A.

ICEIC 2016: International Conference on Electronics, Information, and Communications (ICEIC) 2016. United States : IEEE, Institute of Electrical and Electronics Engineers, 2016. p. 1-7 7563017.

Research output: Book chapter/Published conference paperConference paper

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Singh S, Prasad PWC, Alsadoon A, Beg A, Pham L, Elchouemi A. Survey on memrister models. In ICEIC 2016: International Conference on Electronics, Information, and Communications (ICEIC) 2016. United States: IEEE, Institute of Electrical and Electronics Engineers. 2016. p. 1-7. 7563017 https://doi.org/10.1109/ELINFOCOM.2016.7563017